DI-2010

DI-2010 直接進樣桿裝置

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Direct Sample Inlet Unit for GCMS-TQ Series, GCMS-QP2020/QP2010 Series

直接進樣 (Direct sample injection, DI) 是一種將樣品直接進樣至離子源而不透過氣相層析儀的分析方法，適合於化合物合成的鑑定分析。這也是一種量測合成化合物質譜的有效方法，易與一般的 GC-MS 配置使用。與智慧 EI/CI 離子源結合使用，可以輕鬆取得 EI 和 CI 質譜圖。

特色

  • DI-2010 Features
    DI-2010 特色
    - 可用於分析樹脂和材料相關樣品 (最高溫度 500 °C)
    - 不需移除 GC 烘箱中的管柱即可進行 DI 分析
    - 提供 CI 和 NCI 以及用於 DI 的 EI
    - 操作簡單
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