EPMA-1720

EPMA-1720 電子微探儀

進階分析能力與優異操作技術在演進頂峰的革命性融合，最終帶來高靈敏度、高準確度、高解析度和易於了解的操作

硬體及軟體皆採用最新技術來建立次世代 EPMA。提供簡單且易於了解操作的全新功能，已加入島津多年來精心研發的優異基本 EPMA 效能，提供高靈敏度、高準確度和高解析度，以極致利用 EPMA 的能力。雖然簡單到可讓初學者使用，但也支援由經驗豐富的使用者進行精細分析。

特色

最佳 X 光光譜儀設計提供高度靈敏且準確的分析

維持對分析效能非常重要的 52.5° X 光輸出角度。
前所未見的簡易操作提升從 SEM 觀察到分析的工作效率

光學顯微鏡影像和 SEM 影像在相同監視器上出現。靈敏度極高 ......

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