AXIS Supra+

Imaging X-Ray Photoelectron Spectrometer

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AXIS Supra+

領先的表面分析

X 光光電子光譜分析 (XPS) 具有獨特性，可從材質表面的最上面 10 nm，提供定量元素和化學狀態資訊。AXIS Supra+ (在日本也稱為 Kratos Ultra 2) 是領先業界的 X 光光電子光譜儀，結合最先進的光譜和造影能力，與目前最高等級的自動化。
無與倫比的大面積光譜分析效能，可從所有類型的材質擷取光電子光譜，包括金屬、半導體和絕緣體。快速、高度空間解析度 XPS 造影，顯示表面化學的側向分佈，並協助以選定小面積分析進一步描繪特性。
The AXIS Supra+ 的設計提供彈性，可加入額外表面分析和表面製備選項，而不會降低 XPS 效能。令其成為完整材質表面特性描繪的寶貴工具。

特色

  • Sensitivity
    靈敏度
    AXIS Supra+ 在光譜分析和 XPS 造影模式中提供優異的靈敏度。
  • ease of use
    可用性
    多用途的 ESCApe 軟體研發用於盡可能簡化光譜儀的使用者互動，整合擷取和處理以完全發揮硬體的自動化。
  • 解析度
    解析度
    光譜分析和造影模式中的最佳解析度，是任何光譜儀的最重要基礎特性。
  • full automation
    自動化
    AXIS Supra+ 的自動化可改進光譜儀的易用性，並可擴展光譜儀的所有層面。
  • additional techniques
    其他分析技術
    AXIS Supra+ 不只是光電子光譜儀。可配置完整的額外材質特性描繪技術，而不會降低 XPS 效能。
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