SPM-Nanoa

Scanning Probe Microscope/Atomic Force Microscope

特色

自動觀察

觀察期間調整雷射光束、調整參數設定，並自動進行影像處理
廣泛的功能性

以光學顯微鏡至 SPM 顯微鏡模式擷取銳利影像
節省時間

多項輔助功能可達成快速觀察

更多詳情

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